International Design and Test Workshop

IDT 2007

Cairo, December 16-18, 2007

Important Dates

Submission Deadline:

October 15^th, 2007

Acceptance Letter:

October 30^th, 2007

Final Version:

November 16^th, 2007

The Program Committee consists of leading researchers in the fields of design and testing from all over the world. It is consisting of the following members:

M. Abd-El-Barr – Kuwait University

J. Abraham – University of Texas at Austin

S. Adham – LogicVision

Z. Al-Ars – Delft University

M. Al-Failakawi – Kuwait University

H. AL Hammadi – Etisalat University  College

B. Al-Hashimi – University of Southampton

F. Aloul – American University of Sharjah

G. Aly – SECC

A. Al-Yamani – KFUPM

L. Ammar – Atmel France

K. Arabi – PMC Sierra

E. Bastaki – Dubai Silicon Oasis

V. Beiu – UAE University

D. Borrione – TIMA

L. Bouzaida – ST Microelectronics

A. Chehab – American University of Beirut

G. De Micheli – EPFL

K. ElAyat – American University in Cairo

H. ElHennawy – Ain Shams University

H. Elsimary – Electronics Research Institute

A. El-Maleh – KFUPM

H. Fikry – French University in Egypt

A. Ghonaimy – Ain Shams University

S. Goren – Bahcesehir University

S. Habib – Cairo University

M. Hafed – DFT Microsystems

S. Hamdioui – Delft University

J. Hayes – University of Michigan

Y. Ismail – Northwestern University

A. Kayssi – American University of Beirut

D. Keezer – Georgia Tech

F. Kurdahi – U. of California at Irvine

Y. Massoud – Rice University

S. Mirabbasi – University of British Columbia

A. Mohamed – Electronics Research Institute

S. Mourad – Santa Clara University

M. Nourani – University of Texas at Dallas

M. Pedram – U. of Southern California

C. Ravikumar – Texas Instruments

S. Reda – Brown University

K. Roy – Purdue University

N. Sabry – The French university in Cairo

M. Slamani – IBM

M. Tehranipoor – University of Connecticut

T. Williams – Synopsys

H. Wunderlich – Stuttgart University

Z. Zilic – McGill University

 

Program Committee