Text Box:
International Design and Test Symposium
IDT 2017
Kuwait, December 17-19, 2017

Important Dates

Submission Deadline:

August 18th, 2017

Acceptance Letter:

October 20th, 2017

Final Version:

November 10th, 2017

Rectangle: Rounded Corners:

Topics include, but are not limited to, the following:

Design Methods and Tools:

· IP and SOC Design

· Multiprocessor/Multi-core Systems

· Embedded Systems

· DFX

· Analog, Mixed Signal and RF Design

· High Speed Circuits Design

· Design of MEMS and MOEMS

 

Test and Reliability:

· Automotive Reliability & Test

· IP and SOC Testing

· Multiprocessor/Multi-Core Systems Test

· Memory & FPGA Test & Repair

· Internet of Things Test

· High Speed, Analog, Mixed Signal & RF Testing

· MEMS/MOEMS Testing

 

 

· Low Voltage and Low Power systems

· Innovative Technologies

· Real Time Systems 

· Simulation, Validation & Verification

· System Specification and Modeling

· Formal Methods and Verification

· System Design/Synthesis/Optimization

 

 

· Defect and Fault Modeling

· DFT, BIST and BISR

· On-line Testing / Fault Tolerance

· Fault Simulation, ATPG

· Reliability Failures/ Modeling

· Circuit Reliability

· Electronic System Reliability

 

Workshop Topics