3rd International Design and Test
Workshop
IDT’08 Monastir, Tunisia
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Important dates Submission deadline 9th October 2008
Notification of acceptance 5th November 2008
Final version
21st November 2008
Registration deadline
21st November 2008
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This event provides a unique forum to discuss novel approaches in design, automation and test in the Middle East and Africa (MEA) region for researchers and practitioners in the areas of VLSI design, test and fault tolerance to come together to discuss new research ideas and present new research results. This event will provide the only VLSI Design & Test-specific meeting in the MEA region. Workshop topics include all aspect of design, test and automation.
If your paper will be accepted and you neither register for the conference nor attend and present your paper, then your paper will be omitted from BOTH the conference CD-ROM and the IEEEXplore.
Final
Camera Ready Deadline:
21tst November 2008
Registration
Deadline:
21tst November 2008
Click Here to submit your final camera ready
Click here for IDT registration
IDT
conference appears on the
IEEE Conference
Search and Accepted papers will be included in the
IEEE
Xplore
A selection of best papers will be included in :
1- a special edition of the Analog Integrated Circuits and Signal Processing: the International Journal Springer US
2- a normal edition of the IEEE Design & Test of Computers journal (the best three papers)
GENERAL CO-CHAIRS
Mohamed Abid: CES-ENIS, BP. W, 3038, Sfax, Tunisia
Yervant Zorian: Virage Logic 47100, Bayside Parkway Fremont CA, 94538, USA
